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David Joy Retires

After 30 years’ service at the University of Tennessee and Oak Ridge National Laboratory, ORNL, Professor David Joy has retired. An early member of the Science Alliance’s Distinguished Scientist program, Joy contributed countless hours of research and instruction to both institutions.

Prior to arriving at the university, Joy earned his M.A in Natural Sciences from Trinity College, Cambridge and his PhD in Materials Science from the University of Oxford.

Following his studies at Oxford, Joy led a group which designed and built the first field emission scanning transmission electron microscope outside the United States. With support from the British Government and the Royal Society, Joy’s group also worked on the discovery and application of electron channeling patterns.

In the mid-1970’s Joy relocated to New Jersey to accept a position at AT&T Bell Laboratories, where he remained until joining the Distinguished Scientist program. The appointment provided him joint positions as both a Distinguished Professor at the University of Tennessee and a Distinguished Scientist at ORNL.

Joy continued making invaluable improvements within the field of microscopy and was responsible for the creation of the superior performing Helium Ion Beam microscope, which is more flexible and powerful than electron microscopy and could ultimately offer direct, high resolution imaging at subatomic and subnanometric scales.

Joy’s microscope joined the Zeiss Transmission Electron Microscope at ORNL, which he was directly responsible for acquiring, to a total benefit of more than 5 million dollars in microscopy. Joy also obtained an Atomic Force Microscope and a Scanning Tunneling Microscope for use at the University of Tennessee, in addition to pioneering several problem-solving imaging techniques.

Over the course of his career, Joy has authored or co-authored nine books and more than 400 technical papers, and has given lectures in more than 30 countries. Additionally, he has served as a member of the editorial board for the Journal of Microscopy and as a regular reviewer for a number of major publications, including Nature Materials, Physical Review Letters, Journal of Applied Physics, and Applied Physics Letters.

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